IGOR
WAVES/D	StartDateTime	Duration	LAT	LONGT	subElAl	supElAl	totElAl	subElSi	supElSi	totElSi	subElCa	supElCa	totElCa	subElTi	supElTi	totElTi	subElFe	supElFe	totElFe
BEGIN
	3109437720	72180	37.008	-73.93	11.94	55.99	67.93	19.23	104.23	123.46	0.00	106.18	106.18	0.00	2.33	2.33	4.93	26.26	31.19
	3109544280	25920	40.19	-73.239	0.00	18.44	18.44	0.00	35.85	35.85	0.00	30.44	30.44	0.00	0.00	0.00	0.00	5.18	5.18
	3109582080	18600	40.492	-73.875	48.97	106.40	155.37	97.68	279.35	377.03	21.61	122.48	144.10	7.20	9.20	16.41	58.58	168.39	226.97
	3109604940	19680	40.495	-73.876	62.49	50.71	113.20	136.22	259.44	395.67	0.00	163.96	163.96	15.37	8.42	23.79	54.00	88.11	142.11
	3109662420	18300	40.211	-73.404	0.00	27.44	27.44	108.58	160.01	268.59	42.02	148.33	190.36	0.00	0.00	0.00	52.80	62.10	114.90
	3109687140	13620	40.317	-73.825	6.61	137.47	144.08	266.79	331.20	597.99	74.19	93.09	167.29	0.00	1.53	1.53	102.60	79.80	182.41
	3109711080	33780	40.38	-71.842	23.29	54.40	77.68	102.89	120.88	223.76	21.72	46.37	68.09	0.00	2.67	2.67	33.10	33.92	67.02
	3109748100	18360	40.423	-69.594	0.00	16.04	16.04	58.03	69.44	127.47	0.00	34.96	34.96	0.00	1.35	1.35	24.49	21.38	45.87
	3109770300	21600	41.437	-69.387	0.00	14.59	14.59	20.22	100.27	120.49	0.00	43.16	43.16	0.00	0.00	0.00	0.00	215.48	215.48
	3109795200	30540	42.442	-70.874	69.00	102.46	171.46	204.71	405.49	610.20	37.01	130.12	167.14	1.27	13.64	14.91	76.12	123.94	200.06
	3109834380	11520	42.332	-70.713	31.06	139.24	170.30	273.28	445.10	718.38	80.70	208.71	289.42	0.00	16.31	16.31	100.99	169.96	270.95
	3109848420	12420	42.354	-70.801	0.00	311.28	311.28	0.00	1089.39	1089.39	0.00	575.15	575.15	0.00	12.00	12.00	0.00	294.30	294.30
	3109863240	21360	42.434	-70.822	57.22	239.41	296.63	293.15	632.99	926.13	37.54	436.25	473.80	7.76	18.22	25.99	82.12	175.08	257.20
	3109889280	25920	42.359	-70.807	18.59	137.56	156.15	156.35	325.53	481.88	37.62	242.90	280.52	0.00	9.55	9.55	66.30	86.56	152.86
	3110004420	14160	42.947	-70.724	0.00	0.00	0.00	77.51	20.60	98.11	0.00	0.00	0.00	0.00	0.00	0.00	45.03	0.00	16.94
	3110021520	16380	42.956	-70.716	0.00	0.00	0.00	28.60	58.41	87.01	0.00	0.00	0.00	0.00	0.00	0.00	0.00	5.87	5.87
	3110092560	20460	42.935	-70.53	0.00	0.00	0.00	0.00	64.60	64.60	0.00	38.69	38.69	0.00	0.00	0.00	0.00	39.95	39.95
	3110116680	20580	42.906	-70.647	0.00	4.75	4.75	14.52	64.83	79.35	0.00	80.07	80.07	0.00	0.00	0.00	64.37	0.00	18.98
	3110146080	38520	42.877	-70.661	15.93	28.69	44.62	58.80	50.29	109.09	27.18	33.16	60.34	5.15	0.00	2.53	40.86	5.54	46.39
	3110190960	32280	42.822	-70.629	89.98	132.97	222.95	339.33	356.69	696.02	37.07	109.92	146.99	0.00	10.67	10.67	111.67	96.77	208.44
	3110233800	38520	42.869	-70.401	24.82	69.18	94.00	86.27	164.60	250.87	0.00	111.59	111.59	0.00	6.02	6.02	14.89	53.72	68.61
	3110275680	23340	42.813	-70.717	110.63	160.01	270.64	250.33	471.06	721.39	28.23	191.95	220.18	5.13	18.08	23.21	79.76	156.43	236.20
	3110351700	52560	43.791	-69.349	16.57	20.01	36.58	35.84	51.14	86.98	0.00	21.39	21.39	0.00	0.00	0.00	15.31	0.00	8.67
	3110441580	36960	42.991	-70.479	23.05	14.16	37.21	33.34	51.99	85.32	0.00	38.12	38.12	0.00	0.00	0.00	57.87	0.00	12.60
	3110832420	43500	42.522	-70.681	54.90	46.21	101.11	129.85	125.79	255.64	34.15	50.48	84.63	3.37	3.79	7.16	53.40	53.87	107.27
	3110880300	10080	42.25	-70.364	0.00	141.56	141.56	157.78	369.57	527.36	0.00	139.15	139.15	0.00	7.61	7.61	54.57	110.98	165.55
	3110894520	14520	42.304	-70.692	0.00	79.70	79.70	142.08	160.56	302.65	0.00	78.17	78.17	0.00	0.00	0.00	30.24	56.12	86.36
	3110912580	43740	42.418	-70.664	33.45	36.69	70.14	121.13	99.10	220.23	31.09	48.01	79.09	2.50	3.67	6.18	40.22	38.87	79.09
	3110958780	18840	42.506	-70.703	80.42	80.52	160.95	195.70	204.11	399.81	45.80	117.59	163.39	0.00	6.35	6.35	66.44	81.97	148.41
	3110982540	14820	42.32	-70.789	100.43	0.00	0.00	194.09	0.00	0.00	48.10	0.00	0.00	0.00	0.00	0.00	135.91	0.00	0.00
	3111044700	17940	42.995	-70.655	48.56	95.76	144.31	240.37	221.21	461.58	44.24	101.94	146.18	5.81	2.51	8.33	58.54	75.09	133.62
	3111066780	15900	42.983	-70.688	0.00	27.86	27.86	53.84	103.74	157.58	0.00	52.56	52.56	0.00	0.00	0.00	11.03	24.20	35.24
	3111087360	71160	42.84	-70.492	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00
	3111175020	40260	42.884	-70.548	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00	0.00
	3111217680	20400	42.95	-70.719	0.00	43.08	43.08	19.43	158.95	178.37	0.00	62.94	62.94	0.00	1.35	1.35	5.17	71.07	76.24
	3111241320	25440	42.947	-70.589	9.29	62.46	71.75	57.67	145.26	202.93	0.00	81.69	81.69	0.00	0.00	0.00	21.07	46.89	67.96
	3111272160	27540	42.656	-69.859	37.80	78.53	116.33	125.01	239.44	364.45	20.17	61.39	81.56	2.24	7.10	9.34	31.19	66.24	97.43
	3111304260	30000	42.923	-70.676	0.00	71.98	71.98	46.03	176.06	222.09	0.00	78.79	78.79	0.89	7.27	8.16	3.23	62.87	66.10
	3111342360	45480	42.844	-70.725	42.23	36.88	79.12	90.02	159.41	249.44	11.54	80.27	91.81	5.00	6.39	11.39	26.62	67.38	94.00
	3111390600	28800	42.814	-70.64	12.29	144.56	156.85	100.94	317.05	417.99	16.34	102.05	118.39	8.01	10.99	19.00	27.79	117.27	145.06
	3111424200	22320	42.809	-70.663	103.17	166.01	269.19	294.98	400.83	695.81	40.79	112.91	153.70	1.79	12.44	14.23	89.02	118.35	207.38
	3111536880	30300	40.048	-69.868	0.00	19.85	19.85	36.25	56.71	92.95	0.00	91.89	91.89	0.00	0.00	0.00	2.97	20.24	23.22
	3111569940	25200	39.336	-72.087	0.00	15.29	15.29	45.35	38.31	83.66	0.00	77.91	77.91	0.00	0.00	0.00	13.03	6.58	19.61
	3111612480	40920	37.671	-75.07	26.20	49.00	75.20	103.32	117.74	221.06	14.71	61.76	76.47	0.00	3.88	3.88	39.49	45.56	85.05
	3111656700	32460	36.817	-75.843	47.79	38.82	86.61	173.77	128.71	302.48	17.10	52.51	69.62	0.00	2.63	2.63	54.93	36.38	91.31
END
X SetScale/P x 0,1,"", StartDateTime; SetScale y 0,0,"dat", StartDateTime
X Note StartDateTime, "ACF_PROJECT:NEAQS2002;ACF_PLATFORM:RONALD_H_BROWN;ACF_DATA_TYPE:TIMESERIES-1D;ACF_VERSION:1;ACF_SUBMIT_DATE:06-JUN-2003;ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov"
X SetScale/P x 0,1,"", Duration; SetScale y 0,0,"seconds", Duration
X Note Duration, "ACF_PROJECT:NEAQS2002;ACF_PLATFORM:RONALD_H_BROWN;ACF_DATA_TYPE:TIMESERIES-1D;ACF_VERSION:1;ACF_SUBMIT_DATE:06-JUN-2003;ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov"
X SetScale/P x 0,1,"", LAT; SetScale y 0,0,"Deg", LAT
X Note/NOCR LAT, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR LAT, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR LAT, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR LAT, "ACF_VERSION:1;"
X Note/NOCR LAT, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR LAT, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR LAT, "ACF_LEGAL_MIN:-90;"
X Note/NOCR LAT, "ACF_LEGAL_MAX:90;"
X Note/NOCR LAT, "ACF_UNITS:Deg;"
X Note/NOCR LAT, "ACF_INSTRUMENT:GPS;"
X Note/NOCR LAT, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", LONGT; SetScale y 0,0,"Deg", LONGT
X Note/NOCR LONGT, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR LONGT, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR LONGT, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR LONGT, "ACF_VERSION:1;"
X Note/NOCR LONGT, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR LONGT, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR LONGT, "ACF_LEGAL_MIN:-180;"
X Note/NOCR LONGT, "ACF_LEGAL_MAX:360;"
X Note/NOCR LONGT, "ACF_UNITS:Deg;"
X Note/NOCR LONGT, "ACF_INSTRUMENT:GPS;"
X Note/NOCR LONGT, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", subElAl; SetScale y 0,0,"ug/m3", subElAl
X Note/NOCR subElAl, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR subElAl, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR subElAl, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR subElAl, "ACF_VERSION:1;"
X Note/NOCR subElAl, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR subElAl, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR subElAl, "ACF_LEGAL_MIN:0;"
X Note/NOCR subElAl, "ACF_LEGAL_MAX:100;"
X Note/NOCR subElAl, "ACF_UNITS:ug/m3;"
X Note/NOCR subElAl, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR subElAl, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", supElAl; SetScale y 0,0,"ug/m3", supElAl
X Note/NOCR supElAl, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR supElAl, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR supElAl, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR supElAl, "ACF_VERSION:1;"
X Note/NOCR supElAl, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR supElAl, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR supElAl, "ACF_LEGAL_MIN:0;"
X Note/NOCR supElAl, "ACF_LEGAL_MAX:100;"
X Note/NOCR supElAl, "ACF_UNITS:ug/m3;"
X Note/NOCR supElAl, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR supElAl, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", totElAl; SetScale y 0,0,"ug/m3", totElAl
X Note/NOCR totElAl, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR totElAl, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR totElAl, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR totElAl, "ACF_VERSION:1;"
X Note/NOCR totElAl, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR totElAl, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR totElAl, "ACF_LEGAL_MIN:0;"
X Note/NOCR totElAl, "ACF_LEGAL_MAX:100;"
X Note/NOCR totElAl, "ACF_UNITS:ug/m3;"
X Note/NOCR totElAl, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR totElAl, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", subElSi; SetScale y 0,0,"ug/m3", subElSi
X Note/NOCR subElSi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR subElSi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR subElSi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR subElSi, "ACF_VERSION:1;"
X Note/NOCR subElSi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR subElSi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR subElSi, "ACF_LEGAL_MIN:0;"
X Note/NOCR subElSi, "ACF_LEGAL_MAX:100;"
X Note/NOCR subElSi, "ACF_UNITS:ug/m3;"
X Note/NOCR subElSi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR subElSi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", supElSi; SetScale y 0,0,"ug/m3", supElSi
X Note/NOCR supElSi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR supElSi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR supElSi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR supElSi, "ACF_VERSION:1;"
X Note/NOCR supElSi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR supElSi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR supElSi, "ACF_LEGAL_MIN:0;"
X Note/NOCR supElSi, "ACF_LEGAL_MAX:100;"
X Note/NOCR supElSi, "ACF_UNITS:ug/m3;"
X Note/NOCR supElSi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR supElSi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", totElSi; SetScale y 0,0,"ug/m3", totElSi
X Note/NOCR totElSi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR totElSi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR totElSi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR totElSi, "ACF_VERSION:1;"
X Note/NOCR totElSi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR totElSi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR totElSi, "ACF_LEGAL_MIN:0;"
X Note/NOCR totElSi, "ACF_LEGAL_MAX:100;"
X Note/NOCR totElSi, "ACF_UNITS:ug/m3;"
X Note/NOCR totElSi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR totElSi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", subElCa; SetScale y 0,0,"ug/m3", subElCa
X Note/NOCR subElCa, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR subElCa, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR subElCa, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR subElCa, "ACF_VERSION:1;"
X Note/NOCR subElCa, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR subElCa, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR subElCa, "ACF_LEGAL_MIN:0;"
X Note/NOCR subElCa, "ACF_LEGAL_MAX:100;"
X Note/NOCR subElCa, "ACF_UNITS:ug/m3;"
X Note/NOCR subElCa, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR subElCa, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", supElCa; SetScale y 0,0,"ug/m3", supElCa
X Note/NOCR supElCa, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR supElCa, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR supElCa, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR supElCa, "ACF_VERSION:1;"
X Note/NOCR supElCa, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR supElCa, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR supElCa, "ACF_LEGAL_MIN:0;"
X Note/NOCR supElCa, "ACF_LEGAL_MAX:100;"
X Note/NOCR supElCa, "ACF_UNITS:ug/m3;"
X Note/NOCR supElCa, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR supElCa, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", totElCa; SetScale y 0,0,"ug/m3", totElCa
X Note/NOCR totElCa, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR totElCa, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR totElCa, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR totElCa, "ACF_VERSION:1;"
X Note/NOCR totElCa, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR totElCa, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR totElCa, "ACF_LEGAL_MIN:0;"
X Note/NOCR totElCa, "ACF_LEGAL_MAX:100;"
X Note/NOCR totElCa, "ACF_UNITS:ug/m3;"
X Note/NOCR totElCa, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR totElCa, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", subElTi; SetScale y 0,0,"ug/m3", subElTi
X Note/NOCR subElTi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR subElTi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR subElTi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR subElTi, "ACF_VERSION:1;"
X Note/NOCR subElTi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR subElTi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR subElTi, "ACF_LEGAL_MIN:0;"
X Note/NOCR subElTi, "ACF_LEGAL_MAX:100;"
X Note/NOCR subElTi, "ACF_UNITS:ug/m3;"
X Note/NOCR subElTi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR subElTi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", supElTi; SetScale y 0,0,"ug/m3", supElTi
X Note/NOCR supElTi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR supElTi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR supElTi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR supElTi, "ACF_VERSION:1;"
X Note/NOCR supElTi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR supElTi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR supElTi, "ACF_LEGAL_MIN:0;"
X Note/NOCR supElTi, "ACF_LEGAL_MAX:100;"
X Note/NOCR supElTi, "ACF_UNITS:ug/m3;"
X Note/NOCR supElTi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR supElTi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", totElTi; SetScale y 0,0,"ug/m3", totElTi
X Note/NOCR totElTi, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR totElTi, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR totElTi, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR totElTi, "ACF_VERSION:1;"
X Note/NOCR totElTi, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR totElTi, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR totElTi, "ACF_LEGAL_MIN:0;"
X Note/NOCR totElTi, "ACF_LEGAL_MAX:100;"
X Note/NOCR totElTi, "ACF_UNITS:ug/m3;"
X Note/NOCR totElTi, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR totElTi, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", subElFe; SetScale y 0,0,"ug/m3", subElFe
X Note/NOCR subElFe, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR subElFe, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR subElFe, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR subElFe, "ACF_VERSION:1;"
X Note/NOCR subElFe, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR subElFe, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR subElFe, "ACF_LEGAL_MIN:0;"
X Note/NOCR subElFe, "ACF_LEGAL_MAX:100;"
X Note/NOCR subElFe, "ACF_UNITS:ug/m3;"
X Note/NOCR subElFe, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR subElFe, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", supElFe; SetScale y 0,0,"ug/m3", supElFe
X Note/NOCR supElFe, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR supElFe, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR supElFe, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR supElFe, "ACF_VERSION:1;"
X Note/NOCR supElFe, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR supElFe, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR supElFe, "ACF_LEGAL_MIN:0;"
X Note/NOCR supElFe, "ACF_LEGAL_MAX:100;"
X Note/NOCR supElFe, "ACF_UNITS:ug/m3;"
X Note/NOCR supElFe, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR supElFe, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."
X SetScale/P x 0,1,"", totElFe; SetScale y 0,0,"ug/m3", totElFe
X Note/NOCR totElFe, "ACF_PROJECT:NEAQS2002;"
X Note/NOCR totElFe, "ACF_PLATFORM:RONALD_H_BROWN;"
X Note/NOCR totElFe, "ACF_DATA_TYPE:TIMESERIES-1D;"
X Note/NOCR totElFe, "ACF_VERSION:1;"
X Note/NOCR totElFe, "ACF_SUBMIT_DATE:06-JUN-2003;"
X Note/NOCR totElFe, "ACF_SOURCE:Trish Quinn, Patricia.K.Quinn@noaa.gov;"
X Note/NOCR totElFe, "ACF_LEGAL_MIN:0;"
X Note/NOCR totElFe, "ACF_LEGAL_MAX:100;"
X Note/NOCR totElFe, "ACF_UNITS:ug/m3;"
X Note/NOCR totElFe, "ACF_INSTRUMENT:2-stage impactor -- x-ray emission spectrometry;"
X Note/NOCR totElFe, "ACF_REMARK: NOAA PMEL Trace Elements Data Contact person:  Trish Quinn, quinn@pmel.noaa.gov Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991-- Feely et al., 1998]. Submicron and sub-10 um samples were collected on Teflo filters (1.0 um pore size) mounted in Berner impactors having a D50,aero of 1.1 um and 10 um jet plates, respectively (Berner et al., 1979).  Supermicron elemental concentrations were determined by difference between the submicron and sub-10 um concentrations.  This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis.  Sampling periods ranged from 6 to 24 hours. Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm). Berner et al., Sci. Total Environ., 13,  245 - 261, 1979. Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991. Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998."